The Micro Line and Dot Standard is designed to calibrate imaging devices performing critical measurements. The pattern features known dot and line sizes of 2μm, 3μm, 4μm, 5μm, 6μm, 7μm, 8μm, 9μm, 10μm, 25μm, 50μm, 75μm, 100μm. Calibrating with this target can limit the effects of pixel dithering in image processing algorithms. Target is chrome on glass or chrome on opal.
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