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Reticle Calibration Stage Micrometer

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Select Specifications
NIST Certification:

Common Specifications

Dimensions (mm):
25.4 x 76.2 ±0.100
Thickness (mm):
1.52 ±0.100
Pattern Length (mm):
0.1 - 20.0
Surface Quality:
60-40
Substrate:
Durable Chromium Coating on Glass
Optical Density OD (Average):
>2.0

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Technical Information

 
Pattern Length (mm) Pattern Height (mm) Line Width (μm)
0.10, 0.25, 0.50, 0.75 0.50 10
1.00, 2.50, 5.00, 7.50 1.00 20
10.0, 15.0, 20.0 3.00 40